Automated stressing and testing of semiconductor memory cells

ABSTRACT

A memory cell readable through a bit line and addressable through a word line can be stressed by applying a stress voltage to the bit line for a stress voltage time, and addressing the memory cell through the word line for an addressing time included within the stress voltage time. The memory cell can be tested by writing a data value into the memory cell, stressing the memory cell, reading the stored value from the memory cell, and determining whether the stored value corresponds to the data value. A testable memory array can include a memory cell addressable through a word line and readable through a bit line, a precharge circuit, a stress circuit, and an array built-in self test (ABIST) circuit. The ABIST circuit can be configured to stress the memory cell by applying a stress signal to the stress circuit.

BACKGROUND

The present disclosure generally relates to memory architecture, andmore specifically, to testing of memory cells in a semiconductor memoryarray.

As the design of semiconductor memory arrays advances over time, thenumber and density of memory cells in a memory array generallyincreases. As a result, the quality of the memory cells of a memoryarray may fluctuate. In particular, relatively weak memory cells canchange their cell content data during a read operation. Memory arraytesting may be required to determine and/or monitor the quality ofmemory cells. In particular, read stability memory cells may be testedand/or monitored to ensure that it is at sufficient during the entireestimated lifetime of the memory array. Traditionally, a supplementarypower supply, separate from a supply voltage V_(DD), has been providedfor resell testing. However, providing a supplementary power supply cancaused increased difficulties in wire routing to the memory array andwithin a host integrated circuit (IC) in general.

SUMMARY

An improved memory array that allows read stability tests and methodsfor stressing and testing a memory cell can have certain advantages inincreasing the reliability of semiconductor memory arrays.

Embodiments may be directed towards a method for stressing asemiconductor memory cell. The memory cell may be readable through a bitline and addressable through a word line. The method can includeapplying, to the bit line, a stress voltage for a stress voltage time.The method can also include addressing, through the word line, thememory cell for an addressing time, the addressing time being includedwithin the stress voltage time.

Embodiments may also be directed towards a method for testing asemiconductor memory cell. The memory cell may be readable through a bitline and addressable through a word line. The method can also includewriting a first data value into the memory cell and stressing the memorycell by applying, to the bit line, a stress voltage for a stress voltagetime. The method can also include reading a first stored value from thememory cell and determining whether the first stored value correspondsto the first data value.

Embodiments may also be directed towards a memory array that includes atleast one memory cell. The at least one memory cell can be addressablethrough a word line and readable through a bit line. The memory arraycan also include a precharge circuit, a stress circuit and an arraybuilt-in self test (ABIST), circuit. The ABIST circuit can be configuredto stress the memory cell by providing a stress signal to the stresscircuit.

BRIEF DESCRIPTION OF THE DRAWINGS

The drawings included in the present application are incorporated into,and form part of, the specification. They illustrate embodiments of thepresent disclosure and, along with the description, serve to explain theprinciples of the disclosure. The drawings are only illustrative ofcertain embodiments and do not limit the disclosure.

FIG. 1 depicts a semiconductor memory array.

FIG. 2 depicts example memory array signals over time used in a methodfor applying stress to memory cells of a memory array using a fullstress scheme.

FIG. 3 is a flow diagram illustrating a method for testing memory cellsof a memory array.

FIG. 4 depicts a memory array in a simplified form.

FIG. 5 is a diagram depicting a design process used in semiconductordesign, manufacture, and/or test of the inventive memory array depictedin, according to embodiments of the disclosure.

While the disclosure is amenable to various modifications andalternative forms, specifics thereof have been shown by way of examplein the drawings and will be described in detail. It should beunderstood, however, that the intention is not to limit the disclosureto the particular embodiments described. On the contrary, the intentionis to cover all modifications, equivalents, and alternatives fallingwithin the spirit and scope of the disclosure.

In the drawings and the Detailed Description, like numbers generallyrefer to like components, parts, steps, and processes.

DETAILED DESCRIPTION

The present disclosure may be better understood, and its numerousobjects, features, and advantages made apparent to those skilled in theart by referencing the accompanying drawings.

FIG. 1 depicts a memory array 101 which allows for testing the readstability of the memory cells 102-117 and 118-133. The memory array 101includes “n” memory cells 102-117 connected to a common upper local bitline ULBLT and a common complement upper local bit line ULBLC. Moreover,each of the memory cells 102-117 is connected to a respective word lineWL for addressing the memory cell 102-117 to be read.

The memory array 101 further includes “n” memory cells 118-133 which areconnected to a common lower local bit line LLBLT and to a commoncomplement lower local bit line LLBLC. The memory cells 118-133 areaddressable through respective word lines, not shown. In an exampleembodiment, the number “n” of memory cells 118-133 connected to acommon, complement bit line may be sixteen.

Write circuits 134 and 135 may be used to write data or content into therespective memory cells 102-117 and 118-133. The content of the memorycells 102-117 and 118-133 may be evaluated using local evaluationcircuits 136 and 137. In addition, stress may be applied to the memorycells 102-117 and 118-133 using stress circuits 138 and 139.

In the embodiment shown in FIG. 1, the memory array 101 is symmetricalwith respect to the “true” side and the “complement” side, as well assymmetrical with respect to the upper and lower side. However, in someembodiments, the memory array 101 may also include only one localevaluation circuit 136 or 137 on either the true side or the complementside. Moreover, in some embodiments, the memory array 101 may includeonly an upper or a lower section. In embodiments, it is possible thatonly the true or complement side of the memory cells 102-117 and 118-133may be used for writing content into, and reading the content from, thememory cells 102-117 and 118-133.

The write circuit 134 includes a precharge circuit including thetransistors TPCC and TPCT, which are used for precharging the upperlocal bit line ULBLT and the complement upper local bit line ULBLC, inresponse to an upper precharge signal UPCG. In the embodiment shown inFIG. 1 the transistors TPCC and TPCT are P-channel field-effecttransistors (PFETs).

Two transistors, the N-channel field-effect transistor (NFET) TW1T andthe NFET TW1C, are used for writing data received at the data input DTand the complement data input DC into the memory cells 102-117, inresponse to a signal at the SET input.

The data input DT, the complement data input DC and the SET input arecommon to both the upper write circuit 134 and the lower write circuit135. An upper write enable input UWE and a lower write enable input LWEallow for selecting if the data shall be written, in response to the setsignal, into the upper memory cells 102-117, or into the lower memorycells 118-133.

The memory cells 102-117 and 118-133 may be read using the bit linesULBLC, ULBLT, LLBLC and LLBLT. According to embodiments, the memory cell102 is a static random-access memory (SRAM) memory cell, morespecifically a 6-transistor static random-access memory (6T-SRAM) memorycell. The memory cell 102 includes four transistors TP1, TN1, TP2 andTN2 forming a latch and two transistors TRNC and TRNT used for writingand reading the content stored within the latch.

The latch may be in a state having a logical “low” potential at node Tcausing the transistor TP1 to be conductive and the transistor TN1 to benon-conductive or turned off. Accordingly, the latch has a logical highpotential at node C causing the transistor TP2 to be non-conductive andthe transistor TN2 to be conductive.

Before reading the content of the memory cell 102, the potential of thelocal bit lines ULBLC and ULBLT is raised to a logical “high” level.Afterwards, the memory cell 102 the transistors TRNC and TRNT are causedto be conductive in response to a signal on the word line WL.

In the embodiment shown in FIG. 1, the gates of the transistors TRNC andTRNT are connected to a common word line. However, in some embodiments,the transistors TRNC and TRNT, which allow addressing the memory cell102, may be connected to separate word lines, for example, a regularword line WLT and a complement word line WLC. This connection scheme mayallow for testing the reading circuit on both or on only one of the trueor complement sides of the memory cell 102.

When transistor TN2 is conductive, the bit line ULBLT is pulled down toa logical low voltage. However, if the transistor TN1 is faster inpulling down node C in response to the logical high voltage of the localbit line ULBLT than transistor TN2 is in pulling down node T, the stateof the latch may flip so that a logical high value or potential ispresent at node C.

Memory cells changing their content or data value during a readoperation may be considered as defective, and may need to be avoided.Accordingly, the memory array 101 includes stress circuits 138 and 139for testing the memory cells 102-117 and 118-133. The stress circuits138 and 139 include transistors TUST, TUSC and TLST, TLSC, respectively,for providing additional electric charge to the local bit lines ULBLT,ULBLC, LLBLT and LLBLC in response to a stress signal USTR, LSTR appliedto the gates of the transistors TUST and TUSC as well as TLST and TLSC,respectively.

In the embodiment shown in FIG. 1, the transistor pairs TUST, TUSC andTLST, TLSC are NFETs. Accordingly, the voltage applied to the local bitlines ULBLT, ULBLC, LLBLT and LLBLC is reduced by the threshold voltageV_(T) of the transistors TUST, TUSC, TLST and TLSC. Thus, the voltageV_(DD)-V_(T) is applied to the local bit lines ULBLT, ULBLC, LLBLT andLLBLC. This may be referred to as a “weak flood” of the local bit linesULBLT, ULBLC, LLBLT and LLBLC.

In some embodiments, not shown, the transistor pairs TUST, TUSC andTLST, TLSC may be PFETs. Thus, the stress signal USTR, LSTR applied tothe gates of the transistors TUST and TUSC as well as TLST and TLSC,respectively, will be inverted. Moreover, the conductive PFETs willapply the full voltage V_(DD) to the local bit lines ULBLT, ULBLC, LLBLTand LLBLC. This may be referred to as a “strong flood” of the local bitlines ULBLT, ULBLC, LLBLT and LLBLC.

The local bit lines ULBLT and LLBLC may be read using the localevaluation circuit 136. The local evaluation circuit 136 may read onlythe local bit line ULBLT or only the local bit line LLBLT, or both localbit lines ULBLT and LLBLT, in response to input signals URET and LRET.

The local evaluation circuit 136 includes a pull-down transistor TLETfor pulling down the global bit line GBLT to ground in case one of theactivated local bit line(s) ULBLT, LLBLT is at ground.

A logical low voltage on the input signal URET activates the local bitline ULBLT. The transistor TUT1 becomes conductive and the transistorTUT4 becomes non-conductive. A logical low voltage on the local bit lineULBLT causes transistor TUT2 to be conductive and transistor TLT3 to benon-conductive. Hence, V_(DD) is applied to the gate of transistor TLETthrough conductive transistors TUT1 and TUT2. Accordingly, thetransistor TLET will pull the global bit line GBLT to ground,irrespective of the voltage of the local bit line LLBLT.

A logical low voltage of the input signal LRET activates the local bitline LLBLT. The transistor TLT1 becomes conductive and the transistorTLT4 becomes non-conductive. A logical low voltage on the local bit lineLLBLT causes transistor TLT2 to be conductive and transistor TLT3 to benon-conductive. Hence, V_(DD) is applied to the gate of transistor TLETthrough conductive transistors TLT1 and TLT2. Accordingly, thetransistor TLET will pull the global bit line GBLT to ground,irrespective of the voltage of the local bit line ULBLT. The localevaluation circuit 137 functions in a similar fashion.

Array built-in self test (ABIST) circuits have become popular for usewith on-chip testing of memory arrays. Generally, ABIST circuits maydetermine defective memory cells including dysfunctional wiring. Inputsof the memory may be automatically connected to redundant, functional,memory cells instead of being connected to defective cells. Using anABIST circuit for providing the stress signal to the stress circuit mayallow for regularly testing of the memory cells also for stressresistance, which can result in enhanced reliability of memory cellswithin semiconductor memory arrays.

In some embodiments of the memory array, the ABIST circuit can include awrite protect circuit configured to override, during a read operation.The write protect circuit may prevent stress from being applied to thebit line while data is written into the memory cells.

In some embodiments, the ABIST circuit can include an alternativecontrol input. The alternative control input may allow a stress signalto be applied independently of a stress pattern generated by the ABISTcircuit. The alternative control input may be used by external testingequipment, which tests the memory array after fabrication.

In embodiments, the source of the stress transistor can be connected toV_(DD), and the drain of the stress transistor is connected to the bitline. In embodiments, the source of the stress transistor can beconnected to V_(DD), and the drain of the stress transistor is connectedto the bit line. In some embodiments, the stress transistor can be anNFET, which may allow for a relatively weak stress to be applied to thebit line. In some embodiments the stress transistor can be a PFET, whichmay allow for a relatively strong stress is to be applied to the bitline. In some embodiments, the gate of the stress transistor is drivenby a programmable clock generator, which may be self-resetting. In someembodiments, the memory cell is a 6-transistor SRAM (6T-SRAM) cell,which can include fin field-effect transistor (FINFET) transistors. Insome embodiments of the memory array, the memory cell is an 8-transistorSRAM (8T-SRAM) cell, which can also include FINFET transistors.

FIG. 2 depicts waveforms and an associated method for applying stress tomemory cells of a memory array using a full stress scheme. The waveformdiagram shows, in simplified form, the voltages of the word line WL, theprecharge signal UPCG, the stress signal USTR and the local bit lineULBLT, over time. The continuous, solid lines depict a normal functionalread operation and the dashed lines depict a full stress functional readoperation. As shown with dashed lines, the stress signal USTRtransitions from a logical low level to a logical high level before theprecharging of the local bit line ULBLT is terminated by raising theprecharging signal UPCG to a logical high level and before addressing ofthe memory cells 102-117 is started by raising the word line WL from alogical low level to a logical high level. The dashed line stress signalUSTR remains at a logical high level at least for the time the word lineWL and the precharge signal UPCG are at a logical high level.

While the word line WL is high, the memory cells 102-117 storing alogical low level at the node T try to pull the local bit line ULBLT toground. Simultaneously, the transistor TUST becomes conductive and triesto pull the local bit line ULBLT to V_(DD)-V_(T). Depending on therelative device strengths of the transistors of the memory cells 102-117and the transistor TUST, the local bit line ULBLT will thus assume avalue between ground and V_(DD)-V_(T), as indicated with the verticaldouble arrow. Therefore, the memory cells 102-117 are stressed for theduration the word line WL is at a logical high level. This period may beenlarged by a time Δt as indicated with dashed lines.

For normal functional reading of the memory cells 102-117, the stresssignal USTR, shown with continuous, solid lines, is pulled to groundbefore the precharge signal USTR and the word line WL both transition toa logical high level. The memory cells 102-117, addressed by the wordline WL and storing a logical low level at the node T, will slowly pullthe local bit line ULBLT to ground. At time t2, the addressing of thememory cells 102-117 stops by pulling the word line WL to ground. Theprecharge signal UPCG being pulled to ground again will cause thetransistor TPCT to become conductive again and raise the local bit lineULBLT to V_(DD). The stress signal USTR transitions to a logical highlevel again, only after the word line WL and the precharge signal UPCGhave been pulled to a logical low level.

As indicated in FIG. 2, the stress signal USTR may be inverted,corresponding to the clock cycle tc, which may be considered to start attime t1 and to end at time t4. During a first clock cycle the memorycells 102-117 connected to the local bit line ULBLT may be stressed, andduring a subsequent clock cycle the memory cells 102-117 may befunctionally read. In this manner, it may be determined if applyingstress according to a full stress scheme may “flip” or invert thecontent of the memory cells 102-117 directly in the subsequent clockcycle.

Moreover, the method for testing the memory cells according to the fullstress scheme may be carried out at any frequency, as desired. The clockcycle time may range between an extended time to the cycle timecorresponding to the maximum memory design frequency. Theabove-described full stress scheme may allow for turning on/off thestress on a cycle by cycle basis.

The method described above can include applying a stress voltage to thebit line for a stress voltage time, and addressing the memory cellthrough the word line for an addressing time, where the addressing timeis included within the stress voltage time. Applying the stress voltageduring the entire time the word line is active may be considered as“flood mode” stress. The flood mode stress may stress the memory cellsin a manner comparable to traditional stress techniques withoutrequiring an additional power supply. Reduced in simplified wiring formemory arrays may result from the use of this technique.

In some embodiments, the addressing time is longer than the timerequired for discharging the bit line through the memory cell. In caseof normal functional reading, the addressing time is long enough toallow for almost complete discharging of the bit line. Selectingessentially the same addressing time also during the method forstressing the memory cell may result in a behavior of the memory cellswhich is comparable to the behavior of the memory cells duringfunctional reading at the end of their expected lifetime.

In some embodiments, the stress voltage is V_(DD). Applying a stressvoltage of V_(DD) may be considered as a “strong” stress. Hence, onlyrobust memory cells may resist “flipping” or inverting the contentsstored within them, and therefore pass the test. In some embodiments,the stress voltage is V_(DD)-V_(T). Applying a stress voltage ofV_(DD)-V_(T), i.e. a voltage of V_(DD) reduced by the threshold voltageV_(T) of an N-channel field-effect transistor (NFET) transistor may beconsidered as a “weak” stress. Therefore, an increased number of memorycells may pass the test relative to the number of memory cells passing atest involving a “strong” stress. This type of testing can enhance theyield of the tested memory cells, while providing a sufficient safetymargin for end of life degradation.

FIG. 3 illustrates a method for testing memory cells of a memory array.The process moves from start 300 to operation 301. In operation 301, thesame defined data value is written to all memory cells 102-117 and118-133 (FIG. 1), to be tested. For example, the memory cells 102-117and 118-133 (FIG. 1) may be written to have a logical “low” voltage atnode T.

In a second operation 302, a stress voltage is applied to the memorycells 102-117 and 118-113 (FIG. 1) according to a pulse stress schemeand/or a full stress scheme described above. Then, in operation 303, afunctional read operation is performed on the memory cells 102-117 and118-133 (FIG. 1). In operation 304 it is determined if the result of thefunctional read operation corresponds to the logical data valuerepresented by the voltage, which has been written to node T. If thevalues are different, a weak memory cell has been found and testing maystop in operation 305. If the values correspond to each other, thecomplement or inverted value is written to all memory cells 102-117 and118-133 (FIG. 1) in operation 306. For example, if in operation 301, thememory cells 102-117 and 118-133 (FIG. 1) have been written to have alogical low voltage at node T, the memory cells 102-117 and 118-133(FIG. 1) are written to have a logical high voltage at node T. The samestress is applied to the memory cells 102-117 and 118-133 (FIG. 1) inoperation 307 as in operation 303. In operation 308, all memory cells102-117 and 118-133 (FIG. 1) are read again. In operation 309, the readvalue is compared with the inverted value written in operation 306. Ifthe values are different, a weak memory cell has been found and testingstops at operation 305. If the values are the same, it is determinedthat all memory cells are good and the method stops at operation 310.

In some embodiments, the method for testing memory cells of a memoryarray can also include writing a second data value into the memory cell,where the second data value corresponds to the complement of the firstdata value, stressing the memory cell according to the method describedabove, reading the stored value from the memory cell and determiningwhether the stored value corresponds to the second data value. Bystressing the memory cell for read stability for both possible states ofthe memory cell, due account may be taken for the symmetry of the memorycell.

In some embodiments, stressing the memory cell and reading the memorycell are performed in different cycles. Performing stressing and readingin different cycles may enhance the reliability of the test, becauseinterferences between stressing and reading may be reduced. In someembodiments, stressing the memory cell can be performed in one memorycycle and reading the memory cell is performed in a subsequent memorycycle. This technique may allow for the stress signal to be switchedfrom “stress” to “no-stress” after each memory cycle. This technique mayfacilitate control of the stress signal.

FIG. 4 depicts a memory array 401 in a simplified form. The memory array401 includes memory cells 402-433 which may be addressed through wordlines WL and read through bit line(s) BL. Furthermore, a write circuit434 including a precharge circuit is provided which allows prechargingbit line(s) BL. Moreover, the memory array 401 includes a stress circuit438 configured to apply a stress voltage to the bit line(s) BL, inresponse to a stress signal STR. An ABIST circuit 440 can be used togenerate the stress signal.

The ABIST circuit 440 is configured to perform tests on the memory cells402-433 using various patterns, which may be stored in registers441-444, and which may be assessed by access circuitry 445, in responseto a word active signal WA. The ABIST circuit 440 may provide a signalADR indicating which memory cells 402-433 of the memory array are to beaddressed for writing, reading or stressing. Further, the ABIST circuit440 provides a write enable signal WE indicating that content is to bewritten to the memory cells 402-433 as indicated by the signal ADR.

A local clock generator 446 generates a local clock signal in responseto a global clock signal, particularly in response to a rising orfalling edge of the global clock signal, and a word active signal WA.The pulse width of the local clock signal may be independent of theglobal clock signal. The pulse width of the local clock signal maydetermine the pulse width of the word line signal. Different parametersLS concerning the timing of the local clock signal, e.g., offset, pulsewidth and edge steepness, may be provided to the local clock generator446 by the ABIST circuit 440.

An address converter 447 can receive and convert the signal ADR toactivate the word line(s) of the addressed memory cells 402-433 and toprovide the precharge signal to the corresponding bit line(s).

A test pattern in the ABIST circuit 440 may result in stress beingapplied to the memory cells 402-433 and a stress enable signal SE beingprovided as an input to a write protect circuit 451. The other input ofthe write protect circuit 451 is connected to the write enable signalWE. Accordingly, the write protect circuit 451 only stores a valueindicating that stress is to be applied in the pipeline latch 450 incase the write enable signal WE is not active. The pipeline latch 450can allow for an input setup timing reduction. An AND-gate 449 isprovided at the output of the pipeline latch 450 to allow for analternative control of the stress signal through an alternative controlinput ACTR. The output of the AND-gate 449 is connected to a buffer 448before being transmitted to the stress circuit 438.

FIG. 5 depicts multiple design structures 500 including an input designstructure 520 that is preferably processed by a design process. Designstructure 520 may be a logical simulation design structure generated andprocessed by design process 510 to produce a logically equivalentfunctional representation of a hardware device. Design structure 520 mayalternatively include data or program instructions that, when processedby design process 510, generate a functional representation of thephysical structure of a hardware device. Whether representing functionalor structural design features, design structure 520 may be generatedusing electronic computer-aided design, such as that implemented by acore developer/designer. When encoded on a machine-readable datatransmission, gate array, or storage medium, design structure 520 may beaccessed and processed by at least one hardware or software moduleswithin design process 510 to simulate or otherwise functionallyrepresent an electronic component, circuit, electronic or logic module,apparatus, device, or system such as those shown in FIG. 1, FIG. 4, or acircuit configured for carrying out the methods described in referenceto FIG. 2 and FIG. 3. As such, design structure 520 may include files orother data structures including human or machine-readable source code,compiled structures, and computer-executable code structures that, whenprocessed by a design or simulation data processing system, functionallysimulate or otherwise represent circuits or other levels of hardwarelogic design. Such data structures may include hardware-descriptionlanguage design entities or other data structures conforming to orcompatible with lower-level HDL design languages such as Verilog andVHDL, or higher level design languages such as C or C++.

Design process 510 preferably employs and incorporates hardware orsoftware modules for synthesizing, translating, or otherwise processinga design/simulation functional equivalent of the components, circuits,devices, or logic structures shown in FIG. 1, FIG. 4, or a circuitconfigured for carrying out the methods described in reference to FIG. 2and FIG. 3., to generate a Netlist 580 which may contain designstructures such as design structure 520. Netlist 580 may comprise, forexample, compiled or otherwise processed data structures representing alist of wires, discrete components, logic gates, control circuits, I/Odevices, models, etc. that describe the connections to other elementsand circuits in an integrated circuit design. Netlist 580 may besynthesized using an iterative process in which Netlist 580 isresynthesized at least one times depending on design specifications andparameters for the device. As with other design structure typesdescribed herein, Netlist 580 may be recorded on a machine-readable datastorage medium or programmed into a programmable gate array. The mediummay be a non-volatile storage medium such as a magnetic or optical diskdrive, a programmable gate array, a compact flash, or other flashmemory. Additionally, the medium may be a system or cache memory, bufferspace, or electrically or optically conductive devices and materials onwhich data packets may be transmitted and intermediately stored via theinternet, or other suitable networking means.

Design process 510 may include hardware and software modules forprocessing a variety of input data structure types including Netlist580. Such data structure types may reside, for example, within libraryelements 530 and include a set of commonly used elements, circuits, anddevices, including models, layouts, and symbolic representations, for agiven manufacturing technology (e.g., different technology nodes, 32 nm,45 nm, 90 nm, etc.). The data structure types may further include designspecifications 540, characterization data 550, verification data 560,design rules 570, and test data files 585 which may include input testpatterns, output test results, and other testing information. Designprocess 510 may further include, for example, standard mechanical designprocesses such as stress analysis, thermal analysis, mechanical eventsimulation, process simulation for operations such as casting, molding,and die press forming, etc. One of ordinary skill in the art ofmechanical design can appreciate the extent of possible mechanicaldesign tools and applications used in design process 510, withoutdeviating from the scope and spirit of the disclosure. Design process510 may also include modules for performing standard circuit designprocesses such as timing analysis, verification, design rule checking,place and route operations, etc.

Design process 510 employs and incorporates logic and physical designtools such as HDL compilers and simulation model build tools to processdesign structure 520 together with some or all of the depictedsupporting data structures, along with any additional mechanical designor data, to generate a second design structure 590. Design structure 590resides on a storage medium or programmable gate array in a data formatused for the exchange of data of mechanical devices and structures(e.g., information stored on an IGES, DXF, Parasolid XT, JT, DRG, or anyother suitable format for storing or rendering such mechanical designstructures). Similar to design structure 520, design structure 590preferably comprises at least one files, data structures, or othercomputer-encoded data or instructions that reside on transmission ordata storage media and that, when processed by an ECAD system, generatea logically or otherwise functionally equivalent form of at least one ofthe embodiments of the disclosure shown in FIG. 1, FIG. 4, or a circuitconfigured for carrying out the methods described in reference to FIG. 2and FIG. 3. In one embodiment, design structure 590 may comprise acompiled, executable HDL simulation model that functionally simulatesthe devices shown in FIG. 1, FIG. 4, or a circuit configured forcarrying out the methods described in reference to FIG. 2 and FIG. 3.

Design structure 590 may also employ a data format used for the exchangeof layout data of integrated circuits and/or symbolic data format (e.g.,information stored in a GDSII, GL1, OASIS, map files, or any othersuitable format for storing such design data structures). Designstructure 590 may comprise information such as symbolic data, map files,test data files, design content files, manufacturing data, layoutparameters, wires, levels of metal, vias, shapes, data for routingthrough the manufacturing line, and any other data required by amanufacturer or other designer/developer to produce a device orstructure as described above and shown in FIG. 1, FIG. 4, or a circuitconfigured for carrying out the methods described in reference to FIG. 2and FIG. 3. Design structure 590 may then proceed to a state 595 where,for example, design structure 590 proceeds to tape-out, is released tomanufacturing, is released to a mask house, is sent to another designhouse, is sent back to the customer, etc.

The descriptions of the various embodiments of the present disclosurehave been presented for purposes of illustration, but are not intendedto be exhaustive or limited to the embodiments disclosed. Manymodifications and variations will be apparent to those of ordinary skillin the art without departing from the scope and spirit of the describedembodiments. The terminology used herein was chosen to explain theprinciples of the embodiments, the practical application or technicalimprovement over technologies found in the marketplace, or to enableothers of ordinary skill in the art to understand the embodimentsdisclosed herein.

What is claimed is:
 1. A method for stressing a memory cell of asemiconductor memory array, the memory cell being readable through a bitline and addressable through a word line, the method comprising:applying, to the bit line, a stress voltage for a stress voltage time;and addressing, through the word line, the memory cell for an addressingtime, the addressing time included within the stress voltage time, thesemiconductor memory array having a stress circuit and an array built-inself test (ABIST) circuit configured to stress the memory cell byproviding a stress signal to the stress circuit, the ABIST circuitincluding a write protect circuit configured to override, during a readoperation, a stress enable signal.
 2. The method of claim 1, wherein theaddressing time is greater than a time required for discharging the bitline through the memory cell.
 3. The method of claim 1, wherein thestress voltage is a supply voltage V_(DD).
 4. The method of claim 1,wherein the stress voltage is a supply voltage V_(DD) minus a thresholdvoltage V_(T).
 5. A method for testing a memory cell of a semiconductormemory array, the memory cell being readable through a bit line andaddressable through a word line, the method comprising: writing a firstdata value into the memory cell; stressing the memory cell by applying,to the bit line, a stress voltage for a stress voltage time; reading afirst stored value from the memory cell; and determining whether thefirst stored value corresponds to the first data value, thesemiconductor memory array having a stress circuit and an array built-inself test (ABIST) circuit configured to stress the memory cell byproviding a stress signal to the stress circuit, the ABIST circuitincluding a write protect circuit configured to override, during a readoperation, a stress enable signal.
 6. The method of claim 5, furthercomprising: writing a second data value into the memory cell, the seconddata value corresponding to a complement of the first data value;stressing the memory cell by applying, to the bit line, the stressvoltage for the stress voltage time; reading a second stored value fromthe memory cell; and determining whether the second stored valuecorresponds to the second data value.
 7. The method of claim 5, whereinthe stressing of the memory cell and the reading of the memory cell areperformed in different clock cycles.
 8. The method of claim 7, whereinthe stressing of the memory cell is performed in one clock cycle and thereading of the memory cell is performed in a subsequent clock cycle.